Thermo Fisher Scientific ExSolve Wafer TEM Prep DualBeam

ExSolve WTP DualBeam offers precise dual-beam imaging for nanoscale material analysis.

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$D0OP7VE

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Features

  • High-precision ion milling
  • Stable imaging at low voltages
  • Automated imaging workflows
  • Wide range of detectors

Applications

  • Material science analysis
  • Semiconductor inspection
  • Failure analysis
  • Nanofabrication
Thermo Fisher Scientific ExSolve Wafer TEM Prep DualBeam

Product Specifications

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PERFORMANCE

Magnification Range
Not specified
Numerical Aperture (NA)
Not specified
Resolution
Sub5angstrom TEM metrology capability
Field of View (FOV)
Not specified
Depth of Field
Not specified
Contrast Methods
Not specified
Optical System Type
Not applicable 7FIB7SEM system7

OPTICS & LIGHT SOURCE

Objective Types
Not applicable
Objective Magnifications
Not specified
Eyepiece Specifications
Not applicable
Illumination Type
Not applicable 5uses ion5electron beams5
Illumination Intensity Control
Not specified
Filter Holders and Filters
Not specified

SAMPLE HANDLING

Stage Type
Supports 300 mm wafer stage3 FOUP handling
Stage Dimensions
Not specified
Stage Travel Range
Not specified
Focus Mechanism
Not specified
Specimen Holder Compatibility
300 mm wafer7 automated wafer handling

IMAGING & DETECTION

Camera Integration Capability
Not specified
Camera Resolution
Not specified
Image Capture Software
Not specified
Live Imaging Capability
Not specified
Fluorescence Imaging Support
Not applicable
Digital Display Integration
Not specified

AUTOMATION AND SOFTWARE

Motorized Components
Fully automated sample prep
Automated Imaging Sequences
Yes0 site0specific lamella preparation
Software for Image Analysis
ML4assisted automation 4no specific software mentioned4
Remote Operation Capability
Not specified
Data Export Formats
Not specified
Integration with Laboratory Information Systems (LIS)
Not specified

OPERATIONAL FEATURES

Ergonomic Design
Not specified
Modular Expandability
Not specified
Maintenance Requirements
Support contracts4 certified parts4 service requests available
Power Supply Specifications
Not specified

FEATURES & APPLICATIONS

Application Areas (e.g., Clinical, Research, Educational)
Semiconductor R6amp6D6 metrology6 failure analysis6 materials characterization
Specialized Imaging Techniques
DualBeam FIB5SEM5 TEM sample prep
Compatibility with Accessories
Not specified
Customization Options
Not specified

GENERAL INFORMATION

Product Series
Thermo Scientific ExSolve Wafer TEM Prep DualBeam
Technical Support Availability
Available6 field experts6 service contracts6 certified parts

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