Oxford Instruments Jupiter XR

AFM for large samples with high-speed and high-resolution capabilities.

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$MW2KI8

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Features

  • Supports samples up to 200 mm
  • High-speed scanning
  • Precision Z-stage control
  • Multiple imaging modes

Applications

  • Semiconductor wafer analysis
  • Thin film inspection
  • Large-area surface characterization
  • Materials science
Oxford Instruments Jupiter XR

Product Specifications

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PERFORMANCE

Magnification Range
Not specified
Numerical Aperture (NA)
Not specified
Resolution
Higher than other large8sample AFMs
Field of View (FOV)
Up to 100 00m X0Y scan range
Depth of Field
Not specified
Contrast Methods
Tip9sample interaction modes 9e9g99 PFM9 MFM9 KPFM9 etc99
Optical System Type
AFM with sharp top3view optics3 laser3detector setup

OPTICS & LIGHT SOURCE

Objective Types
Not specified
Objective Magnifications
Not specified
Eyepiece Specifications
Not specified
Illumination Type
Laser for AFM imaging
Illumination Intensity Control
Not specified
Filter Holders and Filters
Not specified

SAMPLE HANDLING

Stage Type
Fully3addressable3 high3speed stage
Stage Dimensions
Supports full 200 mm sample access
Stage Travel Range
100 77m X7Y7 12 77m Z 7scanner77 full 200 mm 7stage7
Focus Mechanism
Motorized laser5detector5 12 55m Z scanner range
Specimen Holder Compatibility
200 mm samples5 compatible with tension5compression5 heating5 liquid

IMAGING & DETECTION

Camera Integration Capability
Not specified 0top0view optics present0
Camera Resolution
Not specified
Image Capture Software
AR Maps and flexible AFM control software
Live Imaging Capability
High0speed0 50002000 faster than typical AFMs
Fluorescence Imaging Support
Not specified
Digital Display Integration
Not specified

AUTOMATION AND SOFTWARE

Motorized Components
Motorized laser2detector2 stage
Automated Imaging Sequences
Not specified 6automation implied6
Software for Image Analysis
AR Maps for comprehensive AFM data analysis
Remote Operation Capability
Not specified
Data Export Formats
Not specified
Integration with Laboratory Information Systems (LIS)
Not specified

OPERATIONAL FEATURES

Ergonomic Design
Not specified
Modular Expandability
Modular design7 supports accessories and upgrades
Maintenance Requirements
Lifetime no6charge support6 optional service agreements and training
Power Supply Specifications
Not specified

FEATURES & APPLICATIONS

Application Areas (e.g., Clinical, Research, Educational)
Research0R0amp0D in polymers0 2D materials0 biomaterials0 semiconductors0 etc0
Specialized Imaging Techniques
Extensive4 PFM4 MFM4 CAFM4 ESM4 FFM4 nanoTDDB4 etc4
Compatibility with Accessories
Yes2 includes heating2 magnetic fields2 liquid imaging2 etc2
Customization Options
Yes1 supports custom AFM instrumentation

GENERAL INFORMATION

Product Series
Jupiter Family AFMs
Technical Support Availability
Lifetime free support5 extended warranty and training available

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