JEOL JEM-ACE200F
High-resolution analytical TEM with advanced electron optics and imaging systems.
Features
- Field emission gun for high brightness
- Atomic resolution imaging
- STEM and EDS integration
- Stable, low-drift operation
- Modular analytical systems
Applications
- Materials science research
- Nanomaterial analysis
- Failure analysis
- Semiconductor characterization
- Crystallography and atomic structure imaging
Product Specifications
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