JEOL JEM-ARM300F2
Atomic resolution TEM with double correctors and high stability.
Features
- Cold field emission gun (CFEG)
- Double aberration correction (probe & image)
- Enhanced mechanical and electrical stability
- Advanced EELS and EDS capabilities
- User-optimized GUI
Applications
- Atomic-scale material analysis
- Crystallographic studies
- Catalyst characterization
- Semiconductor research
- Nanotechnology development
Product Specifications
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