JEOL JEM-ARM200F

High-resolution analytical STEM with cold FEG and advanced optics.

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$SY876C9

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Features

  • Cold field emission gun for high brightness
  • Aberration correctors for high resolution
  • Stable STEM imaging environment
  • EDS and EELS integration
  • Advanced automation software

Applications

  • STEM imaging of nanomaterials
  • Analytical spectroscopy
  • Atomic structure analysis
  • Battery material studies
  • Semiconductor characterization
JEOL JEM-ARM200F

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