JEOL JSM-IT810
High-resolution SEM with user-friendly touchscreen and analytical capabilities.
Features
- Touchscreen-based InTouchScope UI
- High-resolution imaging
- Large chamber for flexible sample sizes
- EDS and WDS compatibility
- Integrated auto functions
Applications
- Failure analysis
- Microstructure observation
- Forensic science
- Semiconductor inspection
- Material characterization
Product Specifications
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