WITec alpha300 Semiconductor Edition

Magnification Range

20x to 100x

Numerical Aperture (NA)

0.5 (20x), 0.9 (100x)

Resolution

~200 nm lateral; 0.1 cm⁻¹ spectral

Field of View (FOV)

Up to 300 x 350 mm; multiple µm² scan sizes

Depth of Field

~900 nm (100x objective)

Contrast Methods

Confocal Raman, PL, white-light

Optical System Type

Confocal Raman & PL microscope

Leica Microsystems DMi1

Magnification Range

Phase contrast at 10x, 20x, 40x

Numerical Aperture (NA)

Condensers: S40/0.45, S80/0.30; Objective NA not specified

Resolution

Not specified; described as delivering high clarity

Field of View (FOV)

FOV20 listed; exact size not specified

Depth of Field

Not specified

Contrast Methods

Phase Contrast, Brightfield

Optical System Type

Inverted; optical system type not specified

Thermo Fisher Scientific Prisma E SEM

Magnification Range

Adjustable via MUI; exact range not specified

Numerical Aperture (NA)

Not applicable / Not specified

Resolution

3.0 nm @ 30 kV (HV/LV/ESEM), 7.0 nm @ 3 kV (BSED, decel)

Field of View (FOV)

Large; e.g., up to 40 mm (Nav-Cam); exact range not specified

Depth of Field

Not specified

Contrast Methods

SE, BSE, CL, STEM (BF, DF, HAADF), ChemiSEM, beam decel, vacuum modes

Optical System Type

Scanning Electron Microscope (SEM)