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$GX140APERFORMANCE
Magnification Range
Numerical Aperture (NA)
Resolution
Field of View (FOV)
Depth of Field
Contrast Methods
Optical System Type
AUTOMATION AND SOFTWARE
Motorized Components
Automated Imaging Sequences
Software for Image Analysis
Remote Operation Capability
Data Export Formats
Integration with Laboratory Information Systems (LIS)
OPERATIONAL FEATURES
Ergonomic Design
Modular Expandability
Maintenance Requirements
Power Supply Specifications
GENERAL INFORMATION
Product Series
Technical Support Availability
Hitachi High-Tech Ultra-high Resolution Scanning Electron Microscope SU9000II
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$5YOM1APERFORMANCE
Magnification Range
Up to 3,000,000× (S-900 was up to 800,000×)
Numerical Aperture (NA)
Not specified
Resolution
0.4 nm SE at 30 kV; 0.7 nm SE at 1 kV (low kV); ~0.2 nm STEM at 30 keV
Field of View (FOV)
Not specified
Depth of Field
Not specified
Contrast Methods
SE, BSE, high-angle BSE, BF/DF Duo-STEM (optional)
Optical System Type
True in-lens electron optics; low-aberration in-lens objective lens; STEM optimized
AUTOMATION AND SOFTWARE
Motorized Components
Not specified
Automated Imaging Sequences
Optional automated sequential acquisition via EM Flow Creator
Software for Image Analysis
Not specified
Remote Operation Capability
Not specified
Data Export Formats
Not specified
Integration with Laboratory Information Systems (LIS)
Not specified
OPERATIONAL FEATURES
Ergonomic Design
Not specified
Modular Expandability
Optional deceleration, EDX detector, BF/DF Duo-STEM, 2nd EELS detector, EM Flow Creator
Maintenance Requirements
Not specified
Power Supply Specifications
Not specified
GENERAL INFORMATION
Product Series
SU9000II Ultra-high Resolution FE-SEM; historical S-900, S-5000, S-5200, S-5500, SU3900SE etc.
Technical Support Availability
Website support, technical magazine, application data, contact info