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$WUN839PERFORMANCE
Magnification Range
Numerical Aperture (NA)
Resolution
Field of View (FOV)
Depth of Field
Contrast Methods
Optical System Type
AUTOMATION AND SOFTWARE
Motorized Components
Automated Imaging Sequences
Software for Image Analysis
Remote Operation Capability
Data Export Formats
Integration with Laboratory Information Systems (LIS)
OPERATIONAL FEATURES
Ergonomic Design
Modular Expandability
Maintenance Requirements
Power Supply Specifications
GENERAL INFORMATION
Product Series
Technical Support Availability
Hitachi High-Tech Scanning Electron Microscope FlexSEM 1000 II
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$4P2KV6PERFORMANCE
Magnification Range
×500 to ×60,000 (examples from images)
Numerical Aperture (NA)
Not specified
Resolution
4.0 nm SE at 20 kV; 5.0 nm BSE at 20 kV
Field of View (FOV)
Not specified
Depth of Field
Not specified
Contrast Methods
SE, BSE, Ultra-Variable-Pressure Detector (UVD)
Optical System Type
New electron optical system; gun bias system; Opti-Bias system
AUTOMATION AND SOFTWARE
Motorized Components
Not explicitly listed; likely motorized for AFC and automation
Automated Imaging Sequences
AFC, ABCC, other automated image quality functions
Software for Image Analysis
Control/navigation focused; specific analysis software not detailed
Remote Operation Capability
Not specified
Data Export Formats
Not specified
Integration with Laboratory Information Systems (LIS)
Not specified
OPERATIONAL FEATURES
Ergonomic Design
Compact (450 mm wide), lab-friendly, easy GUI with touch panel
Modular Expandability
Adaptable, separable units for flexible installation
Maintenance Requirements
Not specified
Power Supply Specifications
Standard wall outlet power
GENERAL INFORMATION
Product Series
FlexSEM 1000 II; related models SU3800/SU3900
Technical Support Availability
Contact/Inquiry options provided; details not specified