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$6S3FYBPERFORMANCE
Magnification Range
Numerical Aperture (NA)
Resolution
Field of View (FOV)
Depth of Field
Contrast Methods
Optical System Type
Bruker Dimension HPI
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$UZWS57PERFORMANCE
Magnification Range
Not provided; AFM operates via nanoscale spatial scanning rather than optical magnification
Numerical Aperture (NA)
Not provided (NA not applicable to AFM)
Resolution
Nanoscale; highest spatial resolution achieved with PeakForce KPFM™ (no specific numerical values)
Field of View (FOV)
Not provided
Depth of Field
Not provided
Contrast Methods
Contact Mode, Tapping Mode, PeakForce Tapping, Exclusive PeakForce Tapping modes, PeakForce QNM, FASTForce Volume™, Conductive-AFM (CAFM), Magnetic Force Microscopy (MFM), PeakForce KPFM™, PeakForce TUNA™ — enables topography, mechanical, nanoelectrical, and magnetic property measurements
Optical System Type
Atomic Force Microscope (AFM)