You have chosen to compare
Sign in to view price
$CJHDP7PERFORMANCE
Magnification Range
Numerical Aperture (NA)
Resolution
Field of View (FOV)
Depth of Field
Contrast Methods
Optical System Type
Hitachi High-Tech Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700
Sign in to view price
$J7IGO1PERFORMANCE
Magnification Range
20 to 2,000,000×
Numerical Aperture (NA)
Not specified
Resolution
SE image: 0.6 nm@15 kV, 0.8 nm@1 kV, 0.9 nm@0.3 kV; max image res 40,960 × 30,720 pixels
Field of View (FOV)
Large FOV; example >120 μm
Depth of Field
Not specified
Contrast Methods
SE, BSE (PD-BSED optional), Upper/Lower/Middle Detectors, Variable Pressure mode, STEM Detector optional
Optical System Type
Ultrahigh-Resolution Schottky FE-SEM (SU8700 model)