Hitachi High-Tech Schottky Field Emission Scanning Electron Microscope SU5000

Magnification Range

Example image at 200kX; specific range not specified

Numerical Aperture (NA)

Not specified (not relevant for SEM)

Resolution

Described as highest quality nano-scale images; no numerical value given

Field of View (FOV)

Example 350 µm × 90 µm; overall range not specified

Depth of Field

Not specified

Contrast Methods

SE and BSE imaging; annular BSE detector for simultaneous topographic/compositional info

Optical System Type

Schottky FE-SEM; mentions new coherent cold field emission source

Motorized Components

Auto axis adjustment (auto-calibration); motorized tilt/rotation via 3D MultiFinder

Automated Imaging Sequences

EM Wizard supports auto-calibration; user-programmed sequences not detailed

Software for Image Analysis

3D reconstruction example; analysis software not specified

Remote Operation Capability

Not specified

Data Export Formats

Not specified

Integration with Laboratory Information Systems (LIS)

Not specified

Ergonomic Design

EM Wizard UI novel and easy to use; physical ergonomics not specified

Modular Expandability

Not specified

Maintenance Requirements

Auto axis adjustment restores optimal condition on demand

Power Supply Specifications

Not specified

Product Series

Schottky FE-SEM SU5000; related Hitachi FE-SEM models include SU3900SE, SU3800SE, SU7000, SU8600, SU8700, SU9000II

Technical Support Availability

Contact info and support section available; details not specified