Hitachi High-Tech Field Emission Transmission Electron Microscope HF5000

Magnification Range

STEM: ×20–×8,000,000; TEM: ×100–×1,500,000

Numerical Aperture (NA)

Not specified

Resolution

STEM (ADF-STEM): 0.078 nm; TEM (lattice): 0.102 nm

Field of View (FOV)

Not specified; wide FOV possible with symmetrical dual SDD

Depth of Field

Not specified

Contrast Methods

ADF-STEM, BF-STEM, Cs-corrected SEM & STEM, ET-type SE detector

Optical System Type

200 kV aberration-corrected TEM/STEM; single objective lens; Cold FE electron gun

Motorized Components

Not specified explicitly; automated aberration corrector and specimen stage movement imply automation

Automated Imaging Sequences

Automated aberration corrector ("single click" operation)

Software for Image Analysis

Image intensity profiles, FFT, EDX elemental mapping implied; no specific software named

Remote Operation Capability

Not specified

Data Export Formats

Not specified; large high-res datasets with EDX

Integration with Laboratory Information Systems (LIS)

Not specified

Ergonomic Design

Newly designed enclosure; embedded monitor screens; console unit and extension optional

Modular Expandability

Optional 2nd monitor, double-tilt holder, console extension, Gatan controller, cooling system, pumps, compressor, screen camera

Maintenance Requirements

Installation site conditions detailed (temp, humidity, power, grounding, cooling, gas); total weight ~5,500 kg; routine maintenance not detailed

Power Supply Specifications

Main unit: AC 200–240 V ±10%, 50/60 Hz, 10 kVA, 50 A breaker; Water recirculator: 3-phase AC 200 V ±5%, 50/60 Hz, 30 A; D-class grounding required

Product Series

HF series Field Emission TEM/STEM; builds on HD-2700 STEM; related to HT7800 TEM series

Technical Support Availability

Contact local reps for installation and support; support info on website