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$7ZO456TPERFORMANCE
Magnification Range
Numerical Aperture (NA)
Resolution
Field of View (FOV)
Depth of Field
Contrast Methods
Optical System Type

JEOL JEM-F200 Multi-purpose Electron Microscope
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$TIYNCQ7PERFORMANCE
Magnification Range
TEM: ×20–×2.0M; STEM: ×200–×150M
Numerical Aperture (NA)
Not specified
Resolution
TEM: 0.10–0.23 nm; STEM: 0.14–0.16 nm (at 200 kV)
Field of View (FOV)
From mm to pm scale via Pico stage drive
Depth of Field
Not specified
Contrast Methods
BF/DF TEM and STEM
Optical System Type
Quad-Lens condenser; Advanced Scan System with descan