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$7ZO456T

PERFORMANCE

Magnification Range
Numerical Aperture (NA)
Resolution
Field of View (FOV)
Depth of Field
Contrast Methods
Optical System Type
JEOL JEM-F200 Multi-purpose Electron Microscope

JEOL JEM-F200 Multi-purpose Electron Microscope

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$TIYNCQ7

PERFORMANCE

Magnification Range

TEM: ×20–×2.0M; STEM: ×200–×150M

Numerical Aperture (NA)

Not specified

Resolution

TEM: 0.10–0.23 nm; STEM: 0.14–0.16 nm (at 200 kV)

Field of View (FOV)

From mm to pm scale via Pico stage drive

Depth of Field

Not specified

Contrast Methods

BF/DF TEM and STEM

Optical System Type

Quad-Lens condenser; Advanced Scan System with descan

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