Hitachi High-Tech Ultrahigh-Resolution Scanning Electron Microscope SU8600
High-resolution and flexible FE-SEM designed for advanced analysis needs.
Features
- Cold field emission gun
- Multi-detector imaging system
- High vacuum and variable pressure modes
- Automated functions for ease of use
Applications
- Nanoscale surface analysis
- Electronics failure diagnostics
- Biological sample examination
- Coating and thin film research
Product Specifications
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