JEOL JSM-IT210

General-purpose SEM with analytical capabilities for routine material analysis.

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$EYZOV

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Features

  • Easy-to-use graphical interface
  • Stable imaging performance
  • Integrated EDS support
  • Compact footprint
  • Auto start-up and shutdown

Applications

  • Metallurgical inspection
  • Quality control in manufacturing
  • Educational research
  • Failure analysis
  • Microstructure studies
JEOL JSM-IT210

Product Specifications

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