JEOL JSM-IT710HR

High-resolution field emission SEM with fast imaging and easy operation.

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$XQFA45

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Features

  • Field emission gun (FEG) for high resolution
  • Fast image acquisition
  • User-friendly operation interface
  • Optional EDS and 3D imaging
  • High vacuum and low vacuum modes

Applications

  • Nanomaterials analysis
  • Electronic component inspection
  • Biomedical sample observation
  • Surface topography study
  • Failure diagnostics
JEOL JSM-IT710HR

Product Specifications

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