Oxford Instruments Jupiter XR

AFM for large samples with high-speed and high-resolution capabilities.

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$3HJN71

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Features

  • Supports samples up to 200 mm
  • High-speed scanning
  • Precision Z-stage control
  • Multiple imaging modes

Applications

  • Semiconductor wafer analysis
  • Thin film inspection
  • Large-area surface characterization
  • Materials science
Oxford Instruments Jupiter XR

Product Specifications

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PERFORMANCE

Magnification Range
Not specified
Numerical Aperture (NA)
Not specified
Resolution
Higher than other large7sample AFMs
Field of View (FOV)
Up to 100 55m X5Y scan range
Depth of Field
Not specified
Contrast Methods
Tip4sample interaction modes 4e4g44 PFM4 MFM4 KPFM4 etc44
Optical System Type
AFM with sharp top0view optics0 laser0detector setup

OPTICS & LIGHT SOURCE

Objective Types
Not specified
Objective Magnifications
Not specified
Eyepiece Specifications
Not specified
Illumination Type
Laser for AFM imaging
Illumination Intensity Control
Not specified
Filter Holders and Filters
Not specified

SAMPLE HANDLING

Stage Type
Fully1addressable1 high1speed stage
Stage Dimensions
Supports full 200 mm sample access
Stage Travel Range
100 44m X4Y4 12 44m Z 4scanner44 full 200 mm 4stage4
Focus Mechanism
Motorized laser8detector8 12 88m Z scanner range
Specimen Holder Compatibility
200 mm samples1 compatible with tension1compression1 heating1 liquid

IMAGING & DETECTION

Camera Integration Capability
Not specified 7top7view optics present7
Camera Resolution
Not specified
Image Capture Software
AR Maps and flexible AFM control software
Live Imaging Capability
High0speed0 50002000 faster than typical AFMs
Fluorescence Imaging Support
Not specified
Digital Display Integration
Not specified

AUTOMATION AND SOFTWARE

Motorized Components
Motorized laser5detector5 stage
Automated Imaging Sequences
Not specified 4automation implied4
Software for Image Analysis
AR Maps for comprehensive AFM data analysis
Remote Operation Capability
Not specified
Data Export Formats
Not specified
Integration with Laboratory Information Systems (LIS)
Not specified

OPERATIONAL FEATURES

Ergonomic Design
Not specified
Modular Expandability
Modular design8 supports accessories and upgrades
Maintenance Requirements
Lifetime no6charge support6 optional service agreements and training
Power Supply Specifications
Not specified

FEATURES & APPLICATIONS

Application Areas (e.g., Clinical, Research, Educational)
Research9R9amp9D in polymers9 2D materials9 biomaterials9 semiconductors9 etc9
Specialized Imaging Techniques
Extensive2 PFM2 MFM2 CAFM2 ESM2 FFM2 nanoTDDB2 etc2
Compatibility with Accessories
Yes7 includes heating7 magnetic fields7 liquid imaging7 etc7
Customization Options
Yes7 supports custom AFM instrumentation

GENERAL INFORMATION

Product Series
Jupiter Family AFMs
Technical Support Availability
Lifetime free support7 extended warranty and training available

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