Oxford Instruments Vero S

High-resolution AFM system optimized for material and device characterization.

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$QVSFZG

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Features

  • Compact and stable design
  • Sub-nanometer resolution imaging
  • Advanced feedback and control systems
  • Ease of integration into labs

Applications

  • Surface topography mapping
  • Device failure analysis
  • Thin film characterization
  • Materials research
Oxford Instruments Vero S

Product Specifications

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