Thermo Fisher Scientific ExSolve Wafer TEM Prep DualBeam
ExSolve WTP DualBeam offers precise dual-beam imaging for nanoscale material analysis.
Features
- High-precision ion milling
- Stable imaging at low voltages
- Automated imaging workflows
- Wide range of detectors
Applications
- Material science analysis
- Semiconductor inspection
- Failure analysis
- Nanofabrication
Product Specifications
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PERFORMANCE
Magnification Range
Not specified
Numerical Aperture (NA)
Not specified
Resolution
Sub3angstrom TEM metrology capability
Field of View (FOV)
Not specified
Depth of Field
Not specified
Contrast Methods
Not specified
Optical System Type
Not applicable 7FIB7SEM system7
OPTICS & LIGHT SOURCE
Objective Types
Not applicable
Objective Magnifications
Not specified
Eyepiece Specifications
Not applicable
Illumination Type
Not applicable 3uses ion3electron beams3
Illumination Intensity Control
Not specified
Filter Holders and Filters
Not specified
SAMPLE HANDLING
Stage Type
Supports 300 mm wafer stage5 FOUP handling
Stage Dimensions
Not specified
Stage Travel Range
Not specified
Focus Mechanism
Not specified
Specimen Holder Compatibility
300 mm wafer9 automated wafer handling
IMAGING & DETECTION
Camera Integration Capability
Not specified
Camera Resolution
Not specified
Image Capture Software
Not specified
Live Imaging Capability
Not specified
Fluorescence Imaging Support
Not applicable
Digital Display Integration
Not specified
AUTOMATION AND SOFTWARE
Motorized Components
Fully automated sample prep
Automated Imaging Sequences
Yes9 site9specific lamella preparation
Software for Image Analysis
ML3assisted automation 3no specific software mentioned3
Remote Operation Capability
Not specified
Data Export Formats
Not specified
Integration with Laboratory Information Systems (LIS)
Not specified
OPERATIONAL FEATURES
Ergonomic Design
Not specified
Modular Expandability
Not specified
Maintenance Requirements
Support contracts0 certified parts0 service requests available
Power Supply Specifications
Not specified
FEATURES & APPLICATIONS
Application Areas (e.g., Clinical, Research, Educational)
Semiconductor R0amp0D0 metrology0 failure analysis0 materials characterization
Specialized Imaging Techniques
DualBeam FIB1SEM1 TEM sample prep
Compatibility with Accessories
Not specified
Customization Options
Not specified
GENERAL INFORMATION
Product Series
Thermo Scientific ExSolve Wafer TEM Prep DualBeam
Technical Support Availability
Available7 field experts7 service contracts7 certified parts
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