Thermo Fisher Scientific FIB-SEM and Laser Ablation

FIB-SEM with Laser Ablation offers precise dual-beam imaging for nanoscale material analysis.

Features

  • Laser ablation integration
  • Rapid material removal
  • High-resolution SEM imaging
  • Flexible sample types

Applications

  • Battery research
  • 3D material analysis
  • Semiconductor failure analysis
  • Nanostructure fabrication

Product Specifications

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