Thermo Fisher Scientific Helios 5 PFIB DualBeam

Helios 5 PFIB DualBeam offers precise dual-beam imaging for nanoscale material analysis.

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Features

  • Plasma FIB for fast milling
  • High current ion beam
  • Advanced SEM detectors
  • Automated workflows

Applications

  • Battery material analysis
  • 3D microstructural imaging
  • Failure analysis
  • Nanostructure fabrication
Thermo Fisher Scientific Helios 5 PFIB DualBeam

Product Specifications

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