Thermo Fisher Scientific Helios 6 HD FIB-SEM
Helios 6 HD DualBeam offers precise dual-beam imaging for nanoscale material analysis.
Features
- Automated Osprey FIB Column for precise milling
- AI-powered AutoTEM 6 for seamless alignment
- Simultaneous SEM imaging and FIB milling
- EasyLift NanoManipulator for extended needle life
- High-resolution imaging down to 0.6 nm SEM
Applications
- Semiconductor failure analysis
- Site-specific TEM sample preparation
- High-throughput metrology
- Materials science research
- 3D structural analysis
Product Specifications
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