Thermo Fisher Scientific Helios 6 HX FIB-SEM
SEM/FIB DualBeam platform for high-precision imaging and microanalysis tasks.
Features
- Superior sub-nanometer SEM resolution
- Advanced automation for workflows
- Accurate and reproducible FIB milling
- Easy TEM lamella preparation
- Integrated analytics suite
- Enhanced in situ imaging
Applications
- Failure analysis in semiconductors
- Microelectronics R&D
- 3D nano-imaging
- Material science and nanofabrication
- Cross-section and depth profiling
- High-precision sample preparation
Product Specifications
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