Thermo Fisher Scientific Helios 6 HXS FIB-SEM
FIB-SEM DualBeam system for sub-nanometer imaging and advanced sample prep.
Features
- High-resolution field emission SEM
- Advanced focused ion beam (FIB) capabilities
- In situ sample prep and analysis
- Immersion lens for enhanced resolution
- Automated TEM lamella prep
- Integrated analytics and detectors
Applications
- Semiconductor failure analysis
- Nanotechnology and material science
- TEM sample preparation
- 3D structural imaging
- Cross-sectional analysis
- Subsurface defect inspection
Product Specifications
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