Thermo Fisher Scientific Phenom ParticleX TC Desktop SEM

Desktop SEM for contamination analysis and technical cleanliness monitoring.

Features

  • Particle size and shape classification
  • Material type identification via EDS
  • Automated cleanliness reporting
  • Easy-to-use workflows
  • Conformance to ISO standards
  • High imaging throughput

Applications

  • Automotive component inspection
  • Electronics and semiconductor QA
  • Cleanroom monitoring
  • Contamination root-cause analysis
  • Manufacturing cleanliness certification
  • Particulate source tracing

Product Specifications

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