Thermo Fisher Scientific Verios 5 XHR SEM
Extreme high-resolution SEM for surface-sensitive and nanoscale imaging applications.
Features
- Resolution below 1 nm at low kV
- Immersion lens technology
- Optimized for nanoscale imaging
- High surface sensitivity
- Advanced detection capabilities
- Low beam current imaging
Applications
- Nanostructure and material characterization
- Failure analysis in microelectronics
- Thin film and coating analysis
- Advanced semiconductor inspection
- Surface and interface studies
- Biological nanostructures
Product Specifications
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