Thermo Fisher Scientific Phenom ParticleX AM Desktop SEM
SEM for AM particle and defect analysis in powder and printed parts.
Features
- Automated particle analysis
- Optimized for AM environments
- Integrated EDS for chemical data
- Fast and reproducible workflows
- High-resolution imaging
- Simple user operation
Applications
- Powder characterization
- Defect and inclusion analysis
- Additive manufacturing QA/QC
- Process validation
- Research on AM materials
- Failure investigation
Product Specifications
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