Bruker Dimension HPI

Hard probe AFM for challenging surfaces and precise metrology tasks.

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$CYD170

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Features

  • Hard probe compatibility
  • High-resolution imaging
  • Industrial-grade components
  • Flexible software integration

Applications

  • Rough surface metrology
  • Failure analysis
  • Thin film measurements
  • Nanotribology
Bruker Dimension HPI

Product Specifications

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