Hitachi High-Tech Field Emission Transmission Electron Microscope HF5000
High-resolution 200 kV TEM/STEM with advanced analytical and in-situ capabilities.
Features
- Fully automated probe-forming spherical aberration corrector
- High-brightness, high-stability cold field emission electron gun (Cold FEG)
- Ultra-stable column and power supplies for enhanced performance
- Simultaneous Cs-corrected SEM & STEM imaging with atomic resolution
- Symmetrical dual 100 mm² EDX detectors for high-sensitivity analysis
- Newly designed enclosure optimized for real laboratory environments
Applications
- Atomic-resolution imaging and spectroscopy
- In-situ analysis under various gaseous environments
- Elemental and chemical analyses of small analytical volumes
- Correlating morphology, structure, and chemistry in materials research
- Advanced studies in nanotechnology and semiconductor analysis
Product Specifications
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