Hitachi High-Tech Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700
High-performance FE-SEM for advanced imaging and elemental analysis.
Features
- High-brightness electron source
- Advanced signal detection system
- Versatile vacuum modes
- User-friendly interface
- High throughput operation
Applications
- Materials science
- Semiconductor inspection
- Metallurgical analysis
- Life sciences imaging
- Failure analysis
Product Specifications
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