JEOL JEM-F200 Multi-purpose Electron Microscope

Multipurpose FEG-TEM for advanced imaging and analysis applications.

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$6GOYVJD

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Features

  • Field emission gun for high brightness
  • Quad-lens condenser system
  • Compact and ergonomic design
  • Automated alignment and operation
  • STEM, EDS, and EELS compatible

Applications

  • Materials research
  • Failure analysis
  • Life sciences imaging
  • Nanostructure studies
  • Routine TEM workflows
JEOL JEM-F200 Multi-purpose Electron Microscope

Product Specifications

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