Thermo Fisher Scientific Phenom ParticleX AM Desktop SEM

SEM for AM particle and defect analysis in powder and printed parts.

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$9UEODW

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Features

  • Automated particle analysis
  • Optimized for AM environments
  • Integrated EDS for chemical data
  • Fast and reproducible workflows
  • High-resolution imaging
  • Simple user operation

Applications

  • Powder characterization
  • Defect and inclusion analysis
  • Additive manufacturing QA/QC
  • Process validation
  • Research on AM materials
  • Failure investigation
Thermo Fisher Scientific Phenom ParticleX AM Desktop SEM

Product Specifications

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